• Your shopping cart is empty!

  • JEDEC JESD89-3A
Provide PDF Format

Learn More

JEDEC JESD89-3A

  • TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATE
  • standard by JEDEC Solid State Technology Association, 11/01/2007
  • Publisher: JEDEC

$36.00$72.00


This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particleinduced SER.

Product Details

Published:
11/01/2007
Number of Pages:
27
File Size:
1 file , 220 KB

Related Products

JEDEC JESD8-21A

JEDEC JESD8-21A

POD135 - 1.35 V PSEUDO OPEN DRAIN I/O..

$34.00 $67.00

JEDEC JESD76-3

JEDEC JESD76-3

STANDARD DESCRIPTION OF 1.5 V CMOS LOGIC DEVICES..

$24.00 $48.00

JEDEC JEP151

JEDEC JEP151

, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power ..

$31.00 $62.00

JEDEC JESD13-B

JEDEC JESD13-B

STANDARD SPECIFICATION FOR DESCRIPTION OF B SERIES CMOS DEVICES..

$40.00 $80.00