Provide PDF Format
JEDEC JESD6 (R2002)
- MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
- standard by JEDEC Solid State Technology Association, 02/01/1967
- Publisher: JEDEC
$30.00$59.00
This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
Related Products
JEDEC JESD51
METHODOLOGY FOR THE THERMAL MEASUREMENT OF COMPONENT PACKAGES (SINGLE SEMICONDUCTOR DEVICE)..
$26.00 $51.00
JEDEC JEP145
GUIDELINE FOR ASSESSING THE CURRENT-CARRYING CAPABILITY OF THE LEADS IN A POWER PACKAGE SYSTEM..
$27.00 $53.00
JEDEC JESD 82-26
DEFINITION OF THE SSTUB32868 REGISTERED BUFFER WITH PARITY FOR 2R x 4 DDR2 RDIMM APPLICATIONS..
$37.00 $74.00