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JEDEC JESD28-1
- N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS
- standard by JEDEC Solid State Technology Association, 09/01/2001
- Publisher: JEDEC
$27.00$54.00
This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.
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