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  • JEDEC JESD 47G.01
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JEDEC JESD 47G.01

  • STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
  • standard by JEDEC Solid State Technology Association, 04/01/2010
  • Publisher: JEDEC

$34.00$67.00


This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.

Product Details

Published:
04/01/2010
Number of Pages:
26
File Size:
1 file , 240 KB

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