• JEDEC JESD 22-A121A (R2014)
Provide PDF Format

Learn More

JEDEC JESD 22-A121A (R2014)

  • MEASURING WHISKER GROWTH ON TIN AND TIN ALLOY SURFACE FINISHES
  • standard by JEDEC Solid State Technology Association, 07/01/2008
  • Publisher: JEDEC

$37.00$74.00


The predominant terminal finishes on electronic components have been Sn-Pb alloys. As the industry moves toward Pb-free components and assembly processes, the predominant terminal finish materials will be pure Sn and alloys of Sn, including Sn-Bi and Sn-Ag. Pure Sn and Sn-based alloy electrodeposits and solder-dipped finishes may grow tin whiskers, which could electrically short across component terminals or break off the component and degrade the performance of electrical or mechanical parts.

Related Products

JEDEC JESD 212

JEDEC JESD 212

GDDR5 SGRAM..

$96.00 $191.00

JEDEC JESD229

JEDEC JESD229

Wide I/O Single Data Rate (Wide I/O SDR)..

$58.00 $116.00

JEDEC JESD76-1

JEDEC JESD76-1

STANDARD DESCRIPTION OF 1.2 V CMOS LOGIC DEVICES (WIDE RANGE OPERATION)..

$24.00 $48.00

JEDEC JEB 19

JEDEC JEB 19

RECOMMENDED CHARACTERIZATION OF MOS SHIFT REGISTERS..

$26.00 $51.00