Provide PDF Format
JEDEC JEP153
- CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPURATURES
- standard by JEDEC Solid State Technology Association, 01/01/2008
- Publisher: JEDEC
$30.00$60.00
This document provides an industry standard method for characterization and monitoring thermal stress test oven temperatures. The procedures described in this document should be used to insure thermal stress test conditions are being achieved and maintained during various test procedures.
Related Products
JEDEC JESD76-1
STANDARD DESCRIPTION OF 1.2 V CMOS LOGIC DEVICES (WIDE RANGE OPERATION)..
$24.00 $48.00
