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ASTM F576-00
- Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
- standard by ASTM International, 01/01/2000
- Publisher: ASTM
$26.00$52.80
Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
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